Radiation Hardening of Electronic Systems Invited Paper

This publication has 8 references indexed in Scilit:

• The impact of technology on radiation-hardened integrated circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1969
• Statistical Modeling of Semiconductor Devices for the Tree Environment
  IEEE Transactions on Nuclear Science, 1968
• Effects of ionizing radiation on oxidized silicon surfaces and planar devices
  Proceedings of the IEEE, 1967
• The Analysis of Radiation Effects in Semiconductor Junction Devices
  IEEE Transactions on Nuclear Science, 1967
• Radiation Hardening of MOS Transistors for Low Ionizing Dose Levels
  IEEE Transactions on Nuclear Science, 1966
• A Study of the Neutron-Induced Base Current Component in Silicon Transistors
  IEEE Transactions on Nuclear Science, 1965
• Surface Effects of Radiation on Transistors*
  Bell System Technical Journal, 1963
• The Effects of Neutron Irradiation on Germanium and Silicon
  Proceedings of the IRE, 1958