High resolution hydrogen profiling in superconducting materials by ion beam analysis (ERD-EXB)

This publication has 13 references indexed in Scilit:

• Alpha-proton elastic scattering analyses up to 4 MeV
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1993
• Nuclear microanalysis by means of 350 keV Van de Graaf accelerator
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
• Profiling of carbon, oxygen and argon contamination in sputter-deposited films using nuclear backscattering and nuclear reaction spectroscopy
  Applied Surface Science, 1991
• RF superconductivity for electron accelerators
  Nuclear Physics News, 1990
• On the oxidation and on the superconductivity of niobium
  Applied Physics A, 1987
• H−, H0, H+ He0, He+ and He2+ fractions of projectiles scattered from 14 different materials at 30 to 340 keV
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
• Use of a magnetic spectrometer to profile light elements by elastic recoil detection
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
• Niobium films for superconducting accelerating cavities
  Applied Physics Letters, 1984
• A method for analysis and profiling of boron, carbon and oxygen impurities in semiconductor wafers by recoil atoms in heavy ion beams
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
• Depth profiling of hydrogen by detection of recoiled protons
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984