Ion microprobe measurements of concentration depth profiles of erbium oxide on thin film erbium metal
- 28 February 1973
- journal article
- research article
- Published by Elsevier in Journal of the Less Common Metals
- Vol. 30 (2) , 317-320
- https://doi.org/10.1016/0022-5088(73)90120-3
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Means of obtaining uniform sputtering in an ion microprobeSurface Science, 1972
- Ion—ion emission — A new tool for mass-spectrometric investigations of processes on the surface and in the bulk of solidsInternational Journal of Mass Spectrometry and Ion Physics, 1972
- Improved ``Tuning'' of Ion Microprobes Using Scandium Thin Film TargetsReview of Scientific Instruments, 1972
- Ion Microprobe Mass AnalyzerScience, 1972
- Observing surface oxidation of molybdenum with the statical method of secondary ion mass spectroscopyChemical Physics Letters, 1970
- Ion Microprobe Mass AnalyzerJournal of Applied Physics, 1967