The application of the (n, α) method for boron depth profiling and channeling-blocking measurements in semiconductor materials
- 15 March 1980
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 170 (1-3) , 151-155
- https://doi.org/10.1016/0029-554x(80)91002-2
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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