Secondary ion mass spectrometry of polymers
- 1 January 1983
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 46, 483-486
- https://doi.org/10.1016/0020-7381(83)80157-0
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Summary Abstract: High‐performance molecular secondary ion mass spectrometry (SIMS)Journal of Vacuum Science and Technology, 1982
- Secondary ion mass spectrometry of metal halides. 2. Evidence for structure in alkali iodide clustersJournal of the American Chemical Society, 1982
- Summary Abstract: On the formation and emission of polyatomic secondary ions from metal saltsJournal of Vacuum Science and Technology, 1982
- Effect of Cluster Surface Energies on Secondary-Ion-Intensity Distributions from Ionic CrystalsPhysical Review Letters, 1981
- Application of dynamic emittance matching to secondary ion mass spectrometryReview of Scientific Instruments, 1981
- Characterization of polymeric thin films by low-damage secondary ion mass spectrometryApplications of Surface Science, 1981
- High-performance secondary ion mass spectrometerReview of Scientific Instruments, 1980
- Local in-depth analysis of ceramic materials by neutral beam secondary ion mass spectrometryInternational Journal of Mass Spectrometry and Ion Physics, 1980
- Investigation of some vinyl polymers by pyrolysis—gas chromatography—mass spectrometryJournal of Analytical and Applied Pyrolysis, 1980
- Charging effects in the secondary ion mass spectrometric analysis of targets containing low-conductivity regionsJournal of Applied Physics, 1980