Effect of Cluster Surface Energies on Secondary-Ion-Intensity Distributions from Ionic Crystals
- 12 October 1981
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 47 (15) , 1046-1049
- https://doi.org/10.1103/physrevlett.47.1046
Abstract
Ultrahigh-mass cluster ions () of the type have been produced by xenon-ion bombardment of CsI and detected by a high-performance secondary-ion mass spectrometer. The mass spectra (ion intensity versus ) show anomalous behavior which is correlated with hypothesized dominance of cubiclike clusters having low surface energies.
Keywords
This publication has 13 references indexed in Scilit:
- High-performance secondary ion mass spectrometerReview of Scientific Instruments, 1980
- Surface structure determinations with ion beamsAccounts of Chemical Research, 1980
- The structure of ionic clusters: Thermodynamic functions, energy surfaces, and SIMSThe Journal of Chemical Physics, 1980
- Experimental and theoretical approaches to the ionization process in secondary-ion emissionSurface Science, 1979
- SIMS study of the mechanism of cluster formation during ion bombardment of alkali halidesThe Journal of Chemical Physics, 1978
- Clusters of alkali halide moleculesThe Journal of Chemical Physics, 1978
- Static secondary ion mass spectroscopy (SSIMS) analysis of the mica surfaceSurface Science, 1978
- The sputtering processes during 6 kev Xe ion beam bombardment of halidesRadiation Effects, 1978
- Infrared absorption in LiF polymers and microcrystalsPhysical Review B, 1977
- Crystal structures and their secondary ion mass spectraSurface Science, 1975