A multilayer exponential model for spreading resistance calculations
- 30 April 1979
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 22 (4) , 405-415
- https://doi.org/10.1016/0038-1101(79)90094-7
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The role of source boundary condition in spreading resistance calculationsSolid-State Electronics, 1978
- Spreading resistance calculations by the use of Gauss-Laguerre quadratureSolid-State Electronics, 1978
- An image method application to multilayer spreading resistance analysisSolid-State Electronics, 1977
- A multilayer correction scheme for spreading resistance measurementsSolid-State Electronics, 1977
- Impurity Profile Measurements of Thin Epitaxial Silicon Wafer by Multilayer Spreading Resistance AnalysisJournal of the Electrochemical Society, 1977
- Spreading resistance calculations for graded structures based on the uniform flux source boundary conditionSolid-State Electronics, 1977
- On the calculation of spreading resistance correction factorsSolid-State Electronics, 1976
- Application of Multilayer Potential Distribution to Spreading Resistance Correction FactorsJournal of the Electrochemical Society, 1969