Surface investigations with a combined scanning electron–scanning tunneling microscope
- 1 May 1990
- Vol. 12 (3) , 126-132
- https://doi.org/10.1002/sca.4950120303
Abstract
We have combined a scanning tunneling microscope (STM) with a scanning electron microscope (SEM) for surface investigations of atomically flat surfaces, ultrathin adsorbate films, and material surfaces. The mechanical stability of the hybrid instrument allows high‐resolution SEM of samples mounted on the STM stage and atomic resolution with the STM. Experimental results of combined SEM/STM investigations on textured material surfaces, submicron structures, and atomically flat conducting surfaces are presented. An example is given for surface machining with the STM under SEM control.Funding Information
- Bundesministerium für Forschung und Technologie (03 M 4008 B0)
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