On 1/f trapping noise in MOSTs
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 37 (9) , 2084-2089
- https://doi.org/10.1109/16.57173
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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