Influence of the gate leakage current on the noise performance of MESFETs and MODFETs

Publisher Website

1 January 1993

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/mwsym.1993.276800

Abstract

No abstract available

This publication has 3 references indexed in Scilit:

High-frequency FET noise performance: a new approach
IEEE Transactions on Electron Devices, 1989
Signal and Noise Properties of Gallium Arsenide Microwave Field-Effect Transistors
Published by Elsevier ,1975
Noise in junction- and MOS-FET's at high temperatures
Solid-State Electronics, 1969