Leakage current mechanism in sub-micron polysilicon thin-film transistors

This publication has 5 references indexed in Scilit:

• Degradation of polysilicon TFTs during dynamic stress
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• The effect of drain offset on current-voltage characteristics in sub micron polysilicon thin-film transistors
  IEEE Transactions on Electron Devices, 1996
• Low Thermal Budget Poly-Si Thin Film Transistors on Glass
  Japanese Journal of Applied Physics, 1991
• Effects of trap-state density reduction by plasma hydrogenation in low-temperature polysilicon TFT
  IEEE Electron Device Letters, 1989
• Anomalous leakage current in LPCVD PolySilicon MOSFET's
  IEEE Transactions on Electron Devices, 1985