Rapid interface parameterization using a single MOS conductance curve

This publication has 4 references indexed in Scilit:

• Interface states on semiconductor/insulator surfaces
  C R C Critical Reviews in Solid State Sciences, 1976
• A method to extract interface state parameters from the MIS parallel conductance technique
  Solid-State Electronics, 1973
• Expedient method of obtaining interface state properties from MIS conductance measurements
  Solid-State Electronics, 1969
• The Si-SiO₂Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique
  Bell System Technical Journal, 1967