Analysis of zirconium–niobium pressure tube surfaces for hydrogen using secondary ion mass spectrometry (SIMS)
- 1 October 1990
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 15 (10) , 591-597
- https://doi.org/10.1002/sia.740151004
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- A SIMS study of the filling of traps for deuterium in krypton-implanted nickelScripta Metallurgica, 1988
- Hydrogen and deuterium profiling at the surface of zirconium alloys: II. The effects of oxidationJournal of Nuclear Materials, 1987
- Hydrogen and deuterium profiling at the surface of zirconium alloys: I. The effects of surface preparationJournal of Nuclear Materials, 1987
- Surface segregation of deuterium in a NbV alloyActa Metallurgica, 1986
- Analysis of Hydrogen in Metals by Secondary Ion Mass Spectrometry (SIMS)*Zeitschrift für Physikalische Chemie, 1986
- Surface and grain boundary segregation of deuterium in nickelActa Metallurgica, 1984
- Quantitative SIMS analysis of hydrogenated amorphous silicon using superimposed deuterium implant standardsNuclear Instruments and Methods in Physics Research, 1983
- Hydrogen depth profiling using SIMS—Problems and their solutionsJournal of Vacuum Science and Technology, 1981
- Profiling hydrogen in materials using ion beamsNuclear Instruments and Methods, 1978
- Ion microprobe analysis for niobium hydride in hydrogen-embrittled niobiumAnalytical Chemistry, 1976