Preparation of cross‐sectional specimens of ceramic thermal barrier coatings for transmission electron microscopy
- 1 April 1990
- journal article
- research article
- Published by Wiley in Journal of Electron Microscopy Technique
- Vol. 14 (4) , 307-312
- https://doi.org/10.1002/jemt.1060140404
Abstract
During the microstructural examination of ceramic thermal barrier coatings by transmission electron microscopy (TEM), initial efforts for the preparation of cross‐sectional thin foils from interface regions by conventional means were mostly failures. Delamination of the Y2O3‐stabilized ZrO2 ceramic coating from the nickel‐base alloy substrate sometimes occurred during fine polishing at around 80 μm thickness but mostly occurred during dimpling. Because of this sensitivity, special techniques for mechanical handling were developed so that ion milling could give thin enough regions of the metal‐ceramic interface. TEM showed convincingly that the highly fragile nature of the coatings is in fact due to the extensive porosity at the interface developed as a result of heat treatment.Keywords
This publication has 6 references indexed in Scilit:
- A new technique for preparing metal/oxide TEM cross sectionsJournal of Electron Microscopy Technique, 1989
- Preparation of cross‐sectional transmission electron microscopy samples by electron beam lithography and reactive ion etchingJournal of Electron Microscopy Technique, 1989
- TEM/STEM Sample Preparation for the Investigation of Solid State Structures: Applications to Electronic Devices and Computer ComponentsMRS Proceedings, 1985
- The preparation of cross‐section specimens for transmission electron microscopyJournal of Electron Microscopy Technique, 1984
- Advances in Transmission Electron Microscope Techniques Applied to Device Failure AnalysisJournal of the Electrochemical Society, 1980
- Cross-sectional specimens for transmission electron microscopyJournal of Applied Physics, 1974