An investigation of graded and uniform base Ge/sub x/Si/sub 1-x/ HBT's using a Monte Carlo simulation
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 42 (2) , 201-208
- https://doi.org/10.1109/16.370079
Abstract
No abstract availableThis publication has 27 references indexed in Scilit:
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