Valence-band parameters and hole mobility of Ge-Si alloys-theory
- 30 April 1983
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 16 (12) , 2237-2249
- https://doi.org/10.1088/0022-3719/16/12/013
Abstract
Using the Lawaetz method the authors have estimated the k.p band parameters and determined the band structure near the valence-band edge of the Ge-Si alloy system. They have also obtained the coupling constants between holes and phonons by Wiley's method. Using these two kinds of parameters they have calculated the time for relaxation of holes due to the lattice scattering, where they have taken into account the nonpolar optical phonon, the impurity scattering due to ionised and neutral centres and also the alloy scattering. The intervalence-band interactions are shown to produce the complicated temperature dependence of the hole mobility.Keywords
This publication has 39 references indexed in Scilit:
- Ohmic hole mobility in cubic semiconductorsJournal of Physics and Chemistry of Solids, 1974
- Scattering Probabilities for Holes I. Deformation Potential and Ionized Impurity Scattering MechanismsPhysica Status Solidi (b), 1973
- Rotational relaxation of HD below 40 KPhysica, 1970
- On the interpretation of the observed hole mass shift with Uniaxial stress in siliconPhysics Letters, 1965
- Band parameters of semiconductors with zincblende, wurtzite, and germanium structureJournal of Physics and Chemistry of Solids, 1963
- Absorption Spectrum of Germanium and Zinc-Blende-Type Materials at Energies Higher than the Fundamental Absorption EdgeJournal of Applied Physics, 1963
- Intrinsic Optical Absorption in Germanium-Silicon AlloysPhysical Review B, 1958
- Cyclotron Resonance in Ge-Si AlloysPhysical Review B, 1955
- Theory of the Electrical Properties of Germanium and SiliconPublished by Elsevier ,1955
- Theory of Impurity Scattering in SemiconductorsPhysical Review B, 1950