Thick sample analysis by ion induced X-rays
- 1 March 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 149 (1-3) , 435-440
- https://doi.org/10.1016/0029-554x(78)90904-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Stopping cross sections and backscattering factors for 4He ions in matter Z = 1–92, E(4He) = 400–4000 keVAtomic Data and Nuclear Data Tables, 1974
- Study of the- and-Shell X Rays of Pb Produced by 0.5 - 14.0-MeV-Proton BeamsPhysical Review A, 1973
- Inner-Shell Vacancy Production in Ion-Atom CollisionsReviews of Modern Physics, 1973
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970