In-situ Kelvin probe and ellipsometry study of the doping of a-Si:H and a-SiC:H layers:
- 1 February 1998
- journal article
- Published by Elsevier in Solar Energy Materials and Solar Cells
- Vol. 51 (2) , 145-153
- https://doi.org/10.1016/s0927-0248(97)00230-4
Abstract
No abstract availableKeywords
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