Scanning and transmission electron microscope investigation of preferential thinning during ion beam milling of an Al–Ag alloy containing γ precipitate plates and the subsequent effects on microanalysis
- 30 April 1999
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 76 (4) , 195-202
- https://doi.org/10.1016/s0304-3991(98)00081-3
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Quantitative analysis of EFTEM elemental distribution imagesUltramicroscopy, 1997
- Diffraction effects in electron spectroscopic imagingUltramicroscopy, 1996
- The resolution limit for elemental mapping in energy-filtering transmission electron microscopyUltramicroscopy, 1995
- Imaging of nanometer-sized precipitates in solids by electron spectroscopic imagingUltramicroscopy, 1995
- Analysis of the development of large area surface topography during ion etchingVacuum, 1990
- Ion beam induced roughness and its effect in AES depth profiling of multilayer Ni/Cr thin filmsSurface and Interface Analysis, 1988
- Atomic mechanisms of precipitate plate growthPhilosophical Magazine A, 1987
- New insight into the development of pyramidal structures on bombarded copper surfacesRadiation Effects, 1980
- The dislocation structures of the broad faces of widmanstätten γ plates in an Al-15% Ag alloyActa Metallurgica, 1967
- The metallography of precipitation in an Al-16% Ag alloyActa Metallurgica, 1961