Diffraction effects in electron spectroscopic imaging
- 30 September 1996
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 65 (1-2) , 95-99
- https://doi.org/10.1016/s0304-3991(96)00062-9
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Dynamical diffraction in electron-energy-loss spectrometry: The independent Bloch-wave modelPhysical Review B, 1996
- Diffraction effects in inner‐shell ionization edges Journal of Microscopy, 1996
- Spatially resolved microanalysis of thin films in the transmission electron microscopeVacuum, 1995
- Background problem in electron-energy-loss spectroscopyPhysical Review B, 1993
- Combination of EELS modes and electron spectroscopic imaging and diffraction in an energy-filtering electron microscopeUltramicroscopy, 1992
- The multiple-scattering problem in electron Compton scattering on solidsPhilosophical Magazine Part B, 1992
- Energy-Filtering Transmission Electron MicroscopyPublished by Elsevier ,1991
- EELS quantification of the elements Ba to Tm by means of N45 edgesJournal of Microscopy, 1989
- Observation of dependent to independent Bloch wave transition in Kikuchi patternsActa Crystallographica Section A Foundations of Crystallography, 1989
- Theory of Image Formation by Inelastically Scattered Electrons in the Electron MicroscopePublished by Elsevier ,1985