On the detailed growth of thin silver films on Si(111)
- 1 July 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 172 (2) , 433-441
- https://doi.org/10.1016/0039-6028(86)90765-x
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Nucleation, growth and the intermediate layer in Ag/Si(100) and Ag/Si(111)Surface Science, 1984
- Surface cleaning of Si(100) and Ag/Si(100): Characterisation by SEM, AES and RHEEDSurface Science, 1984
- Physics and electronics of the noble-metal/elemental-semiconductor interface formation: A status reportSurface Science, 1983
- Low energy electron diffraction, Auger electron spectroscopy and angle-resolved photoemission from silver films on Si(100) and Si(111)Thin Solid Films, 1982
- Initial growth process and surface structure of Ag on Si(111) studied by low-energy Ion-Scattering Spectroscopy (ISS) and LEED-AESSurface Science, 1981
- Atomic Arrangement of the Si(111)-√3×√3-Ag Structure Derived from Low-Energy Ion-Scattering SpectroscopyJapanese Journal of Applied Physics, 1980
- Direct observation of the nucleation and growth modes of Ag/Si(111)Surface Science, 1980
- Investigation of the initial stages of growth of Ag films on Si(111)7 × 7 by a combination of LEED, AES, and UPSSurface Science, 1978
- Quantitative approach of Auger electron spectrometry: I. A formalism for the calculation of surface concentrationsSurface Science, 1977
- Untersuchungen zum schichtwachstum von silber auf der silizium(111)-oberfläche durch beugung langsamer elektronenSurface Science, 1967