A.C. impedance of semiconductor-insulator-metal capacitors
- 1 September 1963
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 6 (5) , 536-539
- https://doi.org/10.1016/0038-1101(63)90041-8
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Field Effect‐Capacitance Analysis of Surface States on SiliconPhysica Status Solidi (b), 1963
- Variation with frequency of the transverse impedance of semiconductor surface layersJournal of Physics and Chemistry of Solids, 1962
- An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodesSolid-State Electronics, 1962
- Field Effect at High Frequency†Journal of Electronics and Control, 1959
- High-Frequency Relaxation Processes in the Field-Effect ExperimentPhysical Review B, 1957
- Statistics of the Recombinations of Holes and ElectronsPhysical Review B, 1952