Magnetic force microscope using a direct resonance frequency sensor operating in air
- 23 November 1992
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 61 (21) , 2607-2609
- https://doi.org/10.1063/1.108142
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Magnetic force microscopy: General principles and application to longitudinal recording mediaJournal of Applied Physics, 1990
- Preparation of magnetic tips for a scanning force microscopeApplied Physics Letters, 1990
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987