Preparation of magnetic tips for a scanning force microscope
- 14 May 1990
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 56 (20) , 2045-2047
- https://doi.org/10.1063/1.102991
Abstract
A simple technique for peparing magnetic tips used in a scanning force microscope is described. In this technique a thin layer of ferromagnetic material is deposited on an etched tungsten tip via sputtering or galvanic deposition. Images of magnetic domains obtained with these tips are presented, demonstrating a lateral resolution of the order of 50–100 nm.Keywords
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