heterostructures: Effective mass and scattering times
- 15 January 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 57 (3) , 1374-1377
- https://doi.org/10.1103/physrevb.57.1374
Abstract
We have observed well-resolved Shubnikov–de Haas oscillations in the two-dimensional electron gas in heterojunctions, and determined the GaN electron effective mass and the quantum scattering time . We found in agreement with theoretical calculations, but slightly smaller than the values previously reported from optical experiments. The value of was found to be sec, which is about a factor of 6 smaller than the classical scattering time sec). This difference between and is attributed to a significant amount of small angle scattering, most likely due to charged defects at the epilayer/substrate interface.
Keywords
This publication has 33 references indexed in Scilit:
- InGaN-Based Multi-Quantum-Well-Structure Laser DiodesJapanese Journal of Applied Physics, 1996
- Determination of the Conduction Band Electron Effective Mass in Hexagonal GaNJapanese Journal of Applied Physics, 1995
- Microwave performance of a 0.25 μm gate AlGaN/GaN heterostructure field effect transistorApplied Physics Letters, 1994
- Large-band-gap SiC, III-V nitride, and II-VI ZnSe-based semiconductor device technologiesJournal of Applied Physics, 1994
- Microwave performance of GaN MESFETsElectronics Letters, 1994
- Candela-class high-brightness InGaN/AlGaN double-heterostructure blue-light-emitting diodesApplied Physics Letters, 1994
- GaN, AlN, and InN: A reviewJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1992
- Plasma Faraday Rotation in n‐Type GaNPhysica Status Solidi (b), 1974
- Infrared Lattice Vibrations and Free-Electron Dispersion in GaNPhysical Review B, 1973
- Optical Absorption and Vacuum-Ultraviolet Reflectance of GaN Thin FilmsPhysical Review Letters, 1970