Starch granule surface imaging using low-voltage scanning electron microscopy and atomic force microscopy
- 31 August 1997
- journal article
- research article
- Published by Elsevier in International Journal of Biological Macromolecules
- Vol. 21 (1-2) , 103-107
- https://doi.org/10.1016/s0141-8130(97)00048-2
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- The AFM as a tool for surface imagingSurface Science, 1994
- Low-voltage scanning electron microscopy: A surface sensitive techniqueJournal of Vacuum Science & Technology A, 1991
- Recent Advances in Knowledge of Starch StructureStarch ‐ Stärke, 1991
- Current concepts of starch structure and its impact on properties.Journal of the Japanese Society of Starch Science, 1986
- Amyloglucosidase-catalysed erosion of native, surface-modified and chlorine-treated wheat starch granules. The influence of surface proteinJournal of Cereal Science, 1985
- Low voltage scanning electron microscopyJournal of Microscopy, 1984
- The Rǒle of Starch in Baked Goods Part 2. The Influence of Purification Procedure on the Surface Properties of the GranuleStarch ‐ Stärke, 1977
- Développement des connaissances sur l'ultrastructure du grain d'amidon. I. L'amidon de bléStarch ‐ Stärke, 1973
- Dégradation in vitro de l'amidon par le suc pancréatique. Etude par microscopie électronique à transmission et à balayageStarch ‐ Stärke, 1973
- Scanning Electron Microscopy of Wheat Starch I. Entire GranulesStarch ‐ Stärke, 1969