Scanning-tunneling-microscopy study of InP(001) surfaces prepared by UHV decapping of metal-organic vapor-phase-epitaxy-grown samples
- 15 May 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 53 (20) , R13257-R13259
- https://doi.org/10.1103/physrevb.53.r13257
Abstract
In this study we report on an investigation of the microscopic structure of InP(001) surfaces grown by metal-organic vapor-phase epitaxy (MOVPE). InP(001) homoepitaxial layers were grown in a MOVPE reactor and capped in situ with a P/As sandwich layer by photodecomposition of the phosphine and arsine precursors in the gas phase. The passivated samples were transferred through atmosphere into a separate UHV system. After thermal desorption of the capping layers, a clear (2×4) LEED pattern was achieved. STM images show large, flat surface areas. Images with atomic resolution reveal a (2×4) surface structure corresponding to an In-rich surface. The microscopic surface structure is discussed in the light of recently proposed structure models.Keywords
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