SIMS analysis of evaporated indium contacts on (HgCd)Te
- 1 April 1986
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 25 (3) , 279-287
- https://doi.org/10.1016/0169-4332(86)90060-7
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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