Metal/n-CdTe interfaces: A study of electrical contacts by deep level transient spectroscopy and ballistic electron emission microscopy
- 1 April 1998
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 42 (4) , 595-604
- https://doi.org/10.1016/s0038-1101(97)00296-7
Abstract
No abstract availableKeywords
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