Single Event Upset In CMOS Static Ram And Latches

This publication has 5 references indexed in Scilit:

• Mechanisms Leading to Single Event Upset
  IEEE Transactions on Nuclear Science, 1986
• Memory SEU simulations using 2-D transport calculations
  IEEE Electron Device Letters, 1985
• Single Event Upset Rate Estimates for a 16-K CMOS SRAM
  IEEE Transactions on Nuclear Science, 1985
• Comparison of Analytical Models and Experimental Results for Single Event Upset in CMOS SRAMs
  IEEE Transactions on Nuclear Science, 1983
• Auger coefficients for highly doped and highly excited silicon
  Applied Physics Letters, 1977