Comments on weak-beam contrast of stacking faults in transmission electron microscopy /1/
- 16 July 1981
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 66 (1) , K63-K66
- https://doi.org/10.1002/pssa.2210660164
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Weak-beam contrast of stacking faults in transmission electron microscopyPhysica Status Solidi (a), 1980
- {113} Loops in electron-irradiated siliconPhilosophical Magazine A, 1979
- Defects in electron-irradiated germaniumPhilosophical Magazine, 1976
- Applications of many beam systematic diffraction contrast in high voltage transmission electron microscopyPhysica Status Solidi (a), 1974