Semiquantitative model for the oxide bias experiment and its application to the study of p^+nn^+ photodiode degradation
- 1 December 1984
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 23 (23) , 4339-4344
- https://doi.org/10.1364/ao.23.004339
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 7 references indexed in Scilit:
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