Measurement of surface contamination using oxygen-ion-induced x rays

15 July 1972

journal article
research article
Published by AIP Publishing in Applied Physics Letters

Vol. 21 (2) , 64-67
https://doi.org/10.1063/1.1654281

Abstract

X rays induced by 20‐MeV oxygen ions have been used to search for trace quantities of lanthanum on the surface of a NaCl crystal. The results demonstrate the sensitivity of the method to small quantities of heavy elements present on low‐Z matrices.

Keywords

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