Considering testability at behavioral level: use of transformations for partial scan cost minimization under timing and area constraints
- 1 May 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 14 (5) , 531-546
- https://doi.org/10.1109/43.384414
Abstract
No abstract availableThis publication has 29 references indexed in Scilit:
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