Synthesizing designs with low-cardinality minimum feedback vertex set for partial scan application

This publication has 16 references indexed in Scilit:

• ALLOCATION AND ASSIGNMENT IN HIGH-LEVEL SYNTHESIS FOR SELF-TESTABLE DATA PATHS
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Incorporating testability considerations in high-level synthesis
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Exploiting hardware sharing in high-level synthesis for partial scan optimization
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• On determining scan flip-flops in partial-scan designs
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Transformations and resynthesis for testability of RT-level control-data path specifications
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1993
• Behavioral synthesis for testability
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1992
• Behavioral synthesis for easy testability in data path scheduling
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1992
• Fast prototyping of datapath-intensive architectures
  IEEE Design & Test of Computers, 1991
• A Survey of High-Level Synthesis Systems
  Published by Springer Nature ,1991
• The high-level synthesis of digital systems
  Proceedings of the IEEE, 1990