The status of reference data, reference materials and reference procedures in surface analysis

This publication has 9 references indexed in Scilit:

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• Standard guide for specimen handling in Auger electron spectroscopy and X‐ray photoelectron spectroscopy (E1078–85)
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• Summary Abstract: Calibration of Auger electron spectrometers for energy and intensity measurement
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• Quantitative analysis of chemical vapor deposition refractory metal silicides
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• Data compilations: their use to improve measurement certainty in surface analysis by aes and xps
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• In SITU implantation and SIMS analysis of D in Si and NbV using an ion microprobe
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• On-line ion implantation for quantification in secondary ion mass spectrometry: determination of trace carbon in thin layers of silicon
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• XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energies
  Surface and Interface Analysis, 1984
• Quantitative SIMS analysis of hydrogenated amorphous silicon using superimposed deuterium implant standards
  Nuclear Instruments and Methods in Physics Research, 1983