Ion implantation and SIMS profiling of impurities in II-VI materials (HgCdTe and CdTe)
- 1 January 1988
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 86 (1-4) , 735-743
- https://doi.org/10.1016/0022-0248(90)90800-z
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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