Investigations on hydrophilic and hydrophobic silicon (100) wafer surfaces by X-ray photoelectron and high-resolution electron energy loss-spectroscopy
- 1 February 1986
- journal article
- research article
- Published by Springer Nature in Applied Physics A
- Vol. 39 (2) , 73-82
- https://doi.org/10.1007/bf00616822
Abstract
No abstract availableKeywords
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