Statistical Testing
- 1 January 1988
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- SMART And FAST: Test Generation for VLSI Scan-Design CircuitsIEEE Design & Test of Computers, 1986
- Statistical Fault AnalysisIEEE Design & Test of Computers, 1985
- Characterizing the LSI Yield Equation from Wafer Test DataIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984
- Random Pattern TestabilityIEEE Transactions on Computers, 1984
- Defect Level as a Function of Fault CoverageIEEE Transactions on Computers, 1981
- An Information Theoretic Approach to Digital Fault TestingIEEE Transactions on Computers, 1981
- When to Use Random TestingIEEE Transactions on Computers, 1978
- On Monte Carlo Testing of Logic Tree NetworksIEEE Transactions on Computers, 1976
- Probabilistic Treatment of General Combinational NetworksIEEE Transactions on Computers, 1975
- An Automatic Test Generation System for Illiac IV Logic BoardsIEEE Transactions on Computers, 1972