When to Use Random Testing
- 1 November 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-27 (11) , 1054-1055
- https://doi.org/10.1109/tc.1978.1674994
Abstract
A probabilistic method for deciding whether a combinational circuit should be tested by random inputs, is given. This decision is based upon certain easily observable circuit parameters, such as, the number of primary inputs, the number of levels, and the average fan in.Keywords
This publication has 9 references indexed in Scilit:
- The Error Latency of a Fault in a Sequential Digital CircuitIEEE Transactions on Computers, 1976
- About Random Fault Detection of Combinational NetworksIEEE Transactions on Computers, 1976
- Probabilistic Analysis of Random Test Generation Method for Irredundant Combinational Logic NetworksIEEE Transactions on Computers, 1975
- The Weighted Random Test-Pattern GeneratorIEEE Transactions on Computers, 1975
- An Advanced Fault Isolation System for Digital LogicIEEE Transactions on Computers, 1975
- Analysis of Logic Circuits with Faults Using Input Signal ProbabilitiesIEEE Transactions on Computers, 1975
- Analysis of the detectability of faults by random test patterns in a special class of NAND networksComputers and Electrical Engineering, 1973
- An Automatic Test Generation System for Illiac IV Logic BoardsIEEE Transactions on Computers, 1972
- On the Necessity to Examine D-Chains in Diagnostic Test Generation—An Example [Letter to the Editor]IBM Journal of Research and Development, 1967