Noise measurements of microwave transistors using an uncalibrated mechanical stub tuner and a built-in reverse six-port reflectometer

This publication has 13 references indexed in Scilit:

• Accuracy improvements in two-port noise parameter extraction method
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• An accurate and repeatable technique for noise parameter measurements
  IEEE Transactions on Instrumentation and Measurement, 1993
• Source-pull/load-pull oscillator measurements at microwave/MM wave frequencies
  IEEE Transactions on Instrumentation and Measurement, 1992
• Accuracy improvements in microwave noise parameter measurements
  IEEE Transactions on Microwave Theory and Techniques, 1989
• Noise modeling and measurement techniques (HEMTs)
  IEEE Transactions on Microwave Theory and Techniques, 1988
• Microwave Noise Characterization of GaAs MESFET's: Evaluation by On-Wafer Low-Frequency Output Noise Current Measurement
  IEEE Transactions on Microwave Theory and Techniques, 1987
• Measurement of Losses in Noise-Matching Networks
  IEEE Transactions on Microwave Theory and Techniques, 1981
• Determination of Microwave Two-Port Noise Parameters Through Computer-Aided Frequency-Conversion Techniques
  IEEE Transactions on Microwave Theory and Techniques, 1979
• An Improved Computational Method for Noise Parameter Measurement
  IEEE Transactions on Microwave Theory and Techniques, 1979
• A Novel Procedure for Receiver Noise Characterization
  IEEE Transactions on Instrumentation and Measurement, 1973