Use of surface behavior diagrams to compare anodic and photochemical oxides of Hg0.8Cd0.2Te
- 30 April 1983
- journal article
- Published by Elsevier in Applications of Surface Science
- Vol. 15 (1-4) , 238-246
- https://doi.org/10.1016/0378-5963(83)90019-3
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Quasisimultaneous SIMS, AES, XPS, and TDMS study of preferential sputtering, diffusion, and mercury evaporation in CdxHg1−xTeSurface Science, 1981
- Oxide and interface properties of anodic films on Hg1−xCdxTeJournal of Vacuum Science and Technology, 1980
- Sputter cleaning and dry oxidation of CdTe, HgTe, and Hg0.8Cd0.2Te surfacesSurface Science, 1980