Specific contact resistivity of metal-semiconductor contacts-a new, accurate method linked to spreading resistance
Open Access
- 1 April 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 35 (4) , 489-497
- https://doi.org/10.1109/16.2483
Abstract
No abstract availableThis publication has 29 references indexed in Scilit:
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