Measurements of interdiffusion in compositionally modulated amorphous Ni/Si multilayers by in situ X-ray diffraction
- 31 January 1994
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 22 (2-3) , 211-216
- https://doi.org/10.1016/0921-5107(94)90246-1
Abstract
No abstract availableKeywords
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