Scanning tunnelling and atomic force microscopy performed with the same probe in one unit
- 1 December 1988
- journal article
- research article
- Published by Wiley in Journal of Microscopy
- Vol. 152 (3) , 871-875
- https://doi.org/10.1111/j.1365-2818.1988.tb01460.x
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Scanning tunneling and atomic force microscopy combinedApplied Physics Letters, 1988
- Atomic force profiling by utilizing contact forcesJournal of Applied Physics, 1988
- Multiple-tip interpretation of anomalous scanning-tunneling-microscopy images of layered materialsPhysical Review B, 1987
- Effect of tip morphology on images obtained by scanning tunneling microscopyPhysical Review B, 1987
- Tip Surface Interactions in STM and AFMPhysica Scripta, 1987
- Role of tip structure in scanning tunneling microscopyApplied Physics Letters, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986