III-V compound thin layer characterization by a chemical bevel angle Auger technique
- 15 March 1986
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 59 (6) , 2026-2030
- https://doi.org/10.1063/1.336384
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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