Silicon MIS structures using samarium oxide films
- 1 July 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 325 (1-2) , 151-155
- https://doi.org/10.1016/s0040-6090(98)00533-1
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Electrical and photoelectrical properties of MIS structures with rare earth oxide films as insulatorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A comparative study of thin film transistors using rare earth oxides as gatesThin Solid Films, 1987
- Photoinjection Studies of Charge Distributions in Oxides of MOS StructuresJournal of Applied Physics, 1971
- Photoemission of Electrons from Silicon into Silicon Dioxide. Effects of Ion Migration in the OxideJournal of Applied Physics, 1966