A novel, low-cost algorithm for sequentially untestable fault identification

This publication has 7 references indexed in Scilit:

• Identifying sequential redundancies without search
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Static logic implication with application to redundancy identification
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• A graph traversal based framework for sequential logic implication with an application to C-cycle redundancy identification
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• FILL and FUNI
  ACM Transactions on Design Automation of Electronic Systems, 2000
• FIRE: a fault-independent combinational redundancy identification algorithm
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1996
• Combinational ATPG theorems for identifying untestable faults in sequential circuits
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1995
• Recursive learning: a new implication technique for efficient solutions to CAD problems-test, verification, and optimization
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1994