Identifying sequential redundancies without search
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 26 references indexed in Scilit:
- Sequential Redundancy Identification Using Verification TechniquesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Sequential logic optimization by redundancy addition and removalPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Surprises in sequential redundancy identificationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- On identifying undetectable and redundant faults in synchronous sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Low-cost redundancy identification for combinational circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Sequentially untestable faults identified without search ("simple implications beat exhaustive search!")Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- On achieving complete testability of synchronous sequential circuits with synchronizing sequencesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- HITEC: a test generation package for sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- FIRE: a fault-independent combinational redundancy identification algorithmIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1996
- Combinational and sequential logic optimization by redundancy addition and removalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1995