Design methodology for low-voltage MOSFETs
- 17 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Sub-50 nm gate length n-MOSFETs with 10 nm phosphorus source and drain junctionsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- 0.1 mu m CMOS devices using low-impurity-channel transistors (LICT)Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Temperature-Scaling Theory for Low-Temperature-Operated MOSFET with Deep-Submicron ChannelJapanese Journal of Applied Physics, 1988